Title |
Self-Consistent PIC Modeling of Near Source Transport of FRIB |
Authors |
- C.Y. Wong
NSCL, East Lansing, Michigan, USA
- K. Fukushima, S.M. Lund
FRIB, East Lansing, USA
|
Abstract |
Self-consistent simulation studies of the FRIB low energy beam transport (LEBT) system are conducted with the PIC code Warp. Transport of the many-species DC ion beam emerging from an Electron Cyclotron Resonance (ECR) ion source is examined in a realistic lattice through the Charge Selection System (CSS) which employs two 90-degree bends, two quadrupole triplets, and slits to collimate non-target species. Simulation tools developed will support commissioning activities on the FRIB front end which begins early operations in 2017. Efficient transverse (xy) slice simulation models using 3D lattice fields are employed within a scripted framework that is readily adaptable to analyze many ion cases and levels of model detail. Effects from large canonical angular momentum (magnetized beam emerging from ECR), thermal spread, nonlinear focusing, and electron neutralization are examined for impact on collimated beam quality.
|
Funding |
Work supported by the U.S. Department of Energy Office of Science under Cooperative Agreement DE-SC0000661 and the National Science Foundation under Grant No. PHY-1102511. |
Paper |
download TUPRC014.PDF [0.410 MB / 4 pages] |
Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
Conference |
LINAC2016, East Lansing, MI, USA |
Series |
Linear Accelerator Conference (28th) |
Proceedings |
Link to full LINAC2016 Proccedings |
Session |
Poster Session |
Date |
27-Sep-16 16:00–17:00 |
Main Classification |
4 Beam Dynamics, Extreme Beams, Sources and Beam Related Technology |
Sub Classification |
4A Beam Dynamics, Beam Simulations, Beam Transport |
Keywords |
lattice, space-charge, ion, simulation, ECR |
Publisher |
JACoW, Geneva, Switzerland |
Editors |
Yoshishige Yamazaki (FRIB/MSU, East Lansing, MI, USA); Alberto Facco (FRIB/MSU, East Lansing, MI, USA); Amy McCausey (FRIB/MSU, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
ISBN |
978-3-95450-169-4 |
Published |
May 2017 |
Copyright |
|