Author: Meyers, S.J.
Paper Title Page
TUPP018 Analysis of Systematic and Random Error in SRF Material Parameter Calculations 465
 
  • S.J. Meyers, M. Liepe, S. Posen
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • M. Liepe
    Cornell University, Ithaca, New York, USA
 
  Funding: NSF Career award PHY-0841213 and DOE award ER41628
To understand the relationship between an RF cavity’s performance and the material on its surface, one must look at various parameters, including energy gap, mean free path, and residual resistance. Though SRIMP fits for seven parameters, three parameters are eliminated using measurement and literature values, and the uncertainty of the fit of the remaining four parameters is further reduced by synthesizing two 3-parameter fits, each from a different data set. To study random error, Monte Carlo simulations were performed of ideal data with added noise; for systematic error, contour plots of normalized residual sum of squares (RSS) of the polymorphic fit on inputted data were generated.
 
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