LINAC2014 - List of Authors (Broemmelsiek, D.R.)

Paper	Title	Page
MOPP058	Z-slicer: A Simple Scheme for Electron Beam Current Profile Shaping in a Linac	183
	J.C.T. Thangaraj, C.M. Baffes, D.R. Broemmelsiek, D.J. Crawford, R.M. Thurman-Keup Fermilab, Batavia, Illinois, USA W.B. Wortley University of Rochester, Rochester, New York, USA
	Short bunches are a premium at accelerator facilities and their applications include THz generation, short bunch production, shaped bunch production, etc. In this work we report on the design of an experiment involving an electron beam about 50 MeV that will be intercepted by a set of metallic slits inside a bunch compressor. After the mask, some electrons are scattered while other pass through un-affected. After exiting the bunch compressor, those electrons that were not affected by the slits will appear as short electron bunches. The key advantage of our scheme is its simplicity, tunability and low cost. The scheme does not require any additional hardware such as lasers, undulator, transverse deflecting cavity. The tuning variable is only the RF-chirp and detection of the bunching requires just a skew quad in the chicane and a transverse screen downstream. A thermal analysis suggests that MHz operation of the linac can be sustained under certain beam conditions without any damage to the slit mask.

Paper

Title

Page

Z-slicer: A Simple Scheme for Electron Beam Current Profile Shaping in a Linac

183

J.C.T. Thangaraj, C.M. Baffes, D.R. Broemmelsiek, D.J. Crawford, R.M. Thurman-Keup
Fermilab, Batavia, Illinois, USA
W.B. Wortley
University of Rochester, Rochester, New York, USA

Short bunches are a premium at accelerator facilities and their applications include THz generation, short bunch production, shaped bunch production, etc. In this work we report on the design of an experiment involving an electron beam about 50 MeV that will be intercepted by a set of metallic slits inside a bunch compressor. After the mask, some electrons are scattered while other pass through un-affected. After exiting the bunch compressor, those electrons that were not affected by the slits will appear as short electron bunches. The key advantage of our scheme is its simplicity, tunability and low cost. The scheme does not require any additional hardware such as lasers, undulator, transverse deflecting cavity. The tuning variable is only the RF-chirp and detection of the bunching requires just a skew quad in the chicane and a transverse screen downstream. A thermal analysis suggests that MHz operation of the linac can be sustained under certain beam conditions without any damage to the slit mask.