LINAC2012 - List of Authors (Kelley, M.J.)

Paper	Title	Page
MOPB018	Analyzing Surface Roughness Dependence of Linear RF Losses	210
	C. Xu The College of William and Mary, Williamsburg, USA M.J. Kelley, C.E. Reece JLAB, Newport News, Virginia, USA
	Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms.

SUPB001	Analyzing Surface Roughness Dependence of Linear RF Losses	1
	C. Xu, M.J. Kelley The College of William and Mary, Williamsburg, USA C.E. Reece JLAB, Newport News, Virginia, USA
	Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms.

MOPB060	RF Surface Impedance Characterization of Potential New Materials for SRF-based Accelerators	312
	B. P. Xiao, G.V. Eremeev, H.L. Phillips, C.E. Reece JLAB, Newport News, Virginia, USA M.J. Kelley, B. P. Xiao The College of William and Mary, Williamsburg, USA
	Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177. In the development of new superconducting materials for possible use in SRF-based accelerators, it is useful to work with small candidate samples rather than complete resonant cavities. The recently commissioned Jefferson Lab rf Surface Impedance Characterization (SIC) system* can presently characterize the central region of 50 mm diameter disk samples of various materials from 2 to 40 K exposed to RF magnetic fields up to 14 mT at 7.4 GHz. We report the measurement results from bulk Nb, thin film Nb on Cu and sapphire substrates, and thin film MgB₂ on sapphire substrate provided by colleagues at JLab and Temple University. We also report on efforts to extend the operating range to higher fields. * B.P. Xiao, et al., RSI, 2011. 82: p. 056104

Paper

Title

Page

Analyzing Surface Roughness Dependence of Linear RF Losses

210

C. Xu
The College of William and Mary, Williamsburg, USA
M.J. Kelley, C.E. Reece
JLAB, Newport News, Virginia, USA

Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms.

SUPB001

Analyzing Surface Roughness Dependence of Linear RF Losses

1

C. Xu, M.J. Kelley
The College of William and Mary, Williamsburg, USA
C.E. Reece
JLAB, Newport News, Virginia, USA

Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
Topographic structure on Superconductivity Radio Frequency (SRF) surfaces can contribute additional cavity RF losses describable in terms of surface RF reflectivity and absorption indices of wave scattering theory. At isotropic homogeneous extent, Power Spectrum Density (PSD) of roughness is introduced and quantifies the random surface topographic structure. PSD obtained from different surface treatments of niobium, such as Buffered Chemical Polishing (BCP), Electropolishing (EP), Nano-Mechanical Polishing (NMP) and Barrel Centrifugal Polishing (CBP) are compared. A perturbation model is utilized to calculate the additional rough surface RF losses based on PSD statistical analysis. This model will not consider that superconductor becomes normal conducting at fields higher than transition field. One can calculate the RF power dissipation ratio between rough surface and ideal smooth surface within this field range from linear loss mechanisms.

MOPB060

RF Surface Impedance Characterization of Potential New Materials for SRF-based Accelerators

312

B. P. Xiao, G.V. Eremeev, H.L. Phillips, C.E. Reece
JLAB, Newport News, Virginia, USA
M.J. Kelley, B. P. Xiao
The College of William and Mary, Williamsburg, USA

Funding: Authored by Jefferson Science Associates, LLC under U.S. DOE Contract No. DE-AC05-06OR23177.
In the development of new superconducting materials for possible use in SRF-based accelerators, it is useful to work with small candidate samples rather than complete resonant cavities. The recently commissioned Jefferson Lab rf Surface Impedance Characterization (SIC) system* can presently characterize the central region of 50 mm diameter disk samples of various materials from 2 to 40 K exposed to RF magnetic fields up to 14 mT at 7.4 GHz. We report the measurement results from bulk Nb, thin film Nb on Cu and sapphire substrates, and thin film MgB₂ on sapphire substrate provided by colleagues at JLab and Temple University. We also report on efforts to extend the operating range to higher fields.
* B.P. Xiao, et al., RSI, 2011. 82: p. 056104