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proceedings of accelator conferences held around the world
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| URL | https://doi.org/10.18429/JACoW-IPAC2024-THPR77 |
|---|---|
| Title | Progress on pulsed electron beams for radiation effects characterization of electronics |
| Authors |
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| Abstract | Ultrafast high-energy pulsed electron beams can provide deep penetration and variable linear energy transfers for testing microelectronics for radiation-induced single-event effects. Early experiments at the UCLA PEGASUS beamline (3 MeV) with 1 ps electron bunches and a 50 $\mu$m spot size yielded charge collection transients that are compared with reference heavy ion data. Sub-micron focusing of the beam would allow for the electron bunch to better mimic ion tracks by saturating the charge collection in a small cross-sectional area while simultaneously providing high spatial resolution to allow for the targeted testing of microelectronic components. Using micron-scale collimators and strong lenses, current experiments are planned at UCLA to achieve smaller spot sizes in pursuit of stronger correlations with heavy-ion data. |
| Paper | download: THPR77.pdf |
| Cite | BibTeX, LaTeX, Text/Word, RIS, EndNote |
| Conference | 15th International Particle Accelerator Conference |
| Series | |
| Location | Nashville, TN |
| Date | 19-24 May 2024 |
| Publisher | JACoW Publishing, Geneva, Switzerland |
| Editorial Board | Fulvia Pilat - Oak Ridge National Laboratory Wolfram Fischer - Brookhaven National Laboratory Robert Saethre - Oak Ridge National Laboratory Petr Anisimov - Los Alamos National Laboratory Ivan Andrian - Elettra-Sincrotrone Trieste S.C.p.A. |
| Online ISBN | 978-3-95450-247-9 |
| Online ISSN | 2673-5490 |
| Received | 15 May 2024 |
| Revised | 21 May 2024 |
| Accepted | 24 May 2024 |
| Issued | 01 July 2024 |
| DOI | 10.18429/JACoW-IPAC2024-THPR77 |
| Pages | 3694-3697 |
| Copyright | Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |