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URL | https://doi.org/10.18429/JACoW-IPAC2024-MOPG48 |
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Title | Overview of R&D activities in the production of high energy photon beams for future user experiments beyond 25 keV at the EuXFEL |
Authors |
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Abstract | Scientific opportunities with very hard XFEL radiation demands dedicated facility development towards FEL operation in the sub-ångström regime. Very hard X-rays provide capabilities of high Q-range coverage and high penetration, and also allow access to the K-edge spectroscopy of high-z materials. Production of such X-rays using FELs takes advantage of general FEL characteristics such as large coherence, short pulse option, variable pump-probe delay control and higher brightness compared to conventional storage ring sources. R$\&$D activities in the characterization and production of high energy photon beams beyond 25 keV has been launched since 2021 at the EuXFEL. Photon beams of 30 keV have been produced, characterized and delivered to experimental hutches. In this paper, we give an overview of the overall development. Obtained results will be discussed. |
Paper | download: MOPG48.pdf |
Cite | BibTeX, LaTeX, Text/Word, RIS, EndNote |
Conference | 15th International Particle Accelerator Conference |
Series | |
Location | Nashville, TN |
Date | 19-24 May 2024 |
Publisher | JACoW Publishing, Geneva, Switzerland |
Editorial Board | Fulvia Pilat - Oak Ridge National Laboratory Wolfram Fischer - Brookhaven National Laboratory Robert Saethre - Oak Ridge National Laboratory Petr Anisimov - Los Alamos National Laboratory Ivan Andrian - Elettra-Sincrotrone Trieste S.C.p.A. |
Online ISBN | 978-3-95450-247-9 |
Online ISSN | 2673-5490 |
Received | 06 May 2024 |
Revised | 22 May 2024 |
Accepted | 23 May 2024 |
Issued | 01 July 2024 |
DOI | 10.18429/JACoW-IPAC2024-MOPG48 |
Pages | 392-395 |
Copyright | Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |