In the novel device described in this presentation uses a simple, strip cathode provides a sheet beam probe for tomography instead of a scanning pencil beam that was used in previous electron probe bunch profile monitors. The apparatus with the strip cathode is smaller, has simpler design and less expensive manufacturing, has better magnetic shielding, has higher sensitivity, higher resolution, has better accuracy of measurement, and better time resolution. With this device it is possible to develop almost ideal tomography diagnostics of bunches in linear accelerators and in circular accelerators and storage rings. Currently we are planning to build a prototype tomography system will be built for testing in a proton or ion beam.