Author: Inzunza, N.
Paper Title Page
THPOTK053 Foiled Again: Solid-State Sample Delivery for High Repetition Rate XFELs 2899
 
  • N. Majernik, N. Inzunza, P. Manwani, J.B. Rosenzweig
    UCLA, Los Angeles, California, USA
  • R.B. Agustsson, A. Moro
    RadiaBeam, Santa Monica, California, USA
  • R. Ash, N.B. Welke
    UW-Madison/PD, Madison, Wisconsin, USA
  • U. Bergmann, A. Halavanau, C. Pellegrini
    SLAC, Menlo Park, California, USA
 
  Funding: Department of Energy DE-SC0009914 and DE-AC02-76SF00515
XFELs today are capable of delivering high intensity pulse trains of x-rays with up-to MHz to sub-GHz frequency. These x-rays, when focused, can ablate a sample in a single shot, requiring the sample material to be replaced in time for the next shot. For some applications, especially serial crystallography, the sample may be renewed as a dilute solution in a high speed jet. Here, we describe the development and characterization of a system to deliver solid state sample material to an XFEL nanofocus. The first application of this system will be an x-ray laser oscillator operating at the copper Kα line with a ~30 ns cavity.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2022-THPOTK053  
About • Received ※ 06 June 2022 — Revised ※ 15 June 2022 — Accepted ※ 16 June 2022 — Issue date ※ 02 July 2022
Cite • reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)