Paper | Title | Page |
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THPOTK053 | Foiled Again: Solid-State Sample Delivery for High Repetition Rate XFELs | 2899 |
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Funding: Department of Energy DE-SC0009914 and DE-AC02-76SF00515 XFELs today are capable of delivering high intensity pulse trains of x-rays with up-to MHz to sub-GHz frequency. These x-rays, when focused, can ablate a sample in a single shot, requiring the sample material to be replaced in time for the next shot. For some applications, especially serial crystallography, the sample may be renewed as a dilute solution in a high speed jet. Here, we describe the development and characterization of a system to deliver solid state sample material to an XFEL nanofocus. The first application of this system will be an x-ray laser oscillator operating at the copper Kα line with a ~30 ns cavity. |
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DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2022-THPOTK053 | |
About • | Received ※ 06 June 2022 — Revised ※ 15 June 2022 — Accepted ※ 16 June 2022 — Issue date ※ 02 July 2022 | |
Cite • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |