FROXGD2
JLab, Newport News, Virginia, USA
Characterization of electron beam properties using optical detection methods through the interaction between photons and electrons such as Compton scattering or electro-optic sampling have been successfully implemented as non-invasive diagnostics at various accelerator facilities. However, such methods often suffer from inherently low sensitivity. Here we present the study of a new type of electron beam diagnostic device for direct optical imaging of electron beams at various energy levels. The concept relies on high sensitivity of atoms, prepared in a specific spin quantum superposition, to the perturbations induced by the passing charged particle. Specifically, the magnetic field of the electrons induces polarization change of the probe light as well as changes in light absorption and fluorescence, enabling direct 3D imaging of the charged particles with high resolution. We report our recent experiment results and the design effort on a compact apparatus intended to be tested with the relativistic electron beams at Jefferson Laboratory.
