JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
@inproceedings{seal:ipac2022-tupotk033,
author = {D.J. Seal and G. Burt and P. Goudket and O.B. Malyshev and H.S. Marks and B.S. Sian and R. Valizadeh},
% author = {D.J. Seal and G. Burt and P. Goudket and O.B. Malyshev and H.S. Marks and B.S. Sian and others},
% author = {D.J. Seal and others},
title = {{First RF Measurements of Planar SRF Thin Films with a High Throughput Test Facility at Daresbury Laboratory}},
booktitle = {Proc. IPAC'22},
% booktitle = {Proc. 13th International Particle Accelerator Conference (IPAC'22)},
pages = {1283--1286},
eid = {TUPOTK033},
language = {english},
keywords = {cavity, SRF, MMI, site, pick-up},
venue = {Bangkok, Thailand},
series = {International Particle Accelerator Conference},
number = {13},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {07},
year = {2022},
issn = {2673-5490},
isbn = {978-3-95450-227-1},
doi = {10.18429/JACoW-IPAC2022-TUPOTK033},
url = {https://jacow.org/ipac2022/papers/tupotk033.pdf},
abstract = {{The research on superconducting thin films for future radio frequency (RF) cavities requires measuring the RF properties of these films. However, coating and testing thin films on full-sized cavities is both challenging and timeconsuming. As a result, films are typically deposited on small, flat samples and characterised using a test cavity. At Daresbury Laboratory, a facility for testing 10 cm diameter samples has recently been commissioned. The cavity uses RF chokes to allow physical and thermal separation between itself and the sample under test. The facility allows for surface resistance measurements at a resonant frequency of 7.8 GHz, at temperatures down to 4 K, maximum RF power of 1 W and peak magnetic fields of a few mT. The main advantage of this system is the simple sample mounting procedure due to no physical welding between the sample and test cavity. This allows for a fast turnaround time of two to three days between samples. As such, this system can be used to quickly identify which samples are performing well under RF and should require further testing at higher gradient. Details of recent upgrades to this facility, together with measurements of both bulk niobium and thin film samples, will be presented.}},
}