JACoW is a publisher in Geneva, Switzerland that publishes the proceedings of accelerator conferences held around the world by an international collaboration of editors.
@inproceedings{keckert:ipac2022-tupotk005,
author = {S. Keckert and W. Ackermann and H. De Gersem and X. Jiang and R. Kleindienst and J. Knobloch and F. Kramer and O. Kugeler and A.Ö. Sezgin and D.B. Tikhonov and M. Vogel and M. Wenskat},
% author = {S. Keckert and W. Ackermann and H. De Gersem and X. Jiang and R. Kleindienst and J. Knobloch and others},
% author = {S. Keckert and others},
title = {{Mitigation of Parasitic Losses in the Quadrupole Resonator Enabling Direct Measurements of Low Residual Resistances of SRF Samples}},
booktitle = {Proc. IPAC'22},
% booktitle = {Proc. 13th International Particle Accelerator Conference (IPAC'22)},
pages = {1196--1199},
eid = {TUPOTK005},
language = {english},
keywords = {niobium, quadrupole, SRF, cavity, simulation},
venue = {Bangkok, Thailand},
series = {International Particle Accelerator Conference},
number = {13},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {07},
year = {2022},
issn = {2673-5490},
isbn = {978-3-95450-227-1},
doi = {10.18429/JACoW-IPAC2022-TUPOTK005},
url = {https://jacow.org/ipac2022/papers/tupotk005.pdf},
abstract = {{The quadrupole resonator (QPR) is a dedicated sample-test cavity for the RF characterization of superconducting samples in a wide temperature, RF field and frequency range. Its main purpose are high resolution measurements of the surface resistance with direct access to the residual resistance thanks to the low frequency of the first operating quadrupole mode. Besides the well-known high resolution of the QPR, a bias of measurement data towards higher values has been observed, especially at higher harmonic quadrupole modes. Numerical studies show that this can be explained by parasitic RF losses on the adapter flange used to mount samples into the QPR. Coating several micrometer of niobium on those surfaces of the stainless steel flange that are exposed to the RF fields significantly reduced this bias, enabling a direct measurement of a residual resistance smaller than 5 nano-Ohm at 2 K and 413 MHz.}},
}