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https://doi.org/10.18429/JACoW-IPAC2022-TUPOTK052
Title Influence of a Positive Grid Biasing on RF System in J-PARC RCS
Authors
  • M. Yamamoto, M. Nomura, H. Okitapresenter, T. Shimada, F. Tamura
    JAEA/J-PARC, Tokai-Mura, Naka-Gun, Ibaraki-Ken, Japan
  • K. Hara, K. Hasegawa, C. Ohmori, Y. Sugiyama, M. Yoshii
    KEK, Tokai, Ibaraki, Japan
Abstract In order to accelerate a high intensity beam in the RCS, a large amplitude of the anode current is provided by a tube amplifier to compensate a heavy beam loading. Tetrode vacuum tubes are used in the RCS, and the control grid voltage enters into a positive region to feed such a large current. The positive grid biasing affects the waveform of the control grid voltage; it is deformed due to the induced control grid current under the condition of the multi-harmonic rf driving. Furthermore, the DC bias voltage drop on the control grid is observed because of the exceeding the ability for the control grid power supply. We describe the influence of the positive grid biasing in the RCS.
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Conference IPAC2022
Series International Particle Accelerator Conference (13th)
Location Bangkok, Thailand
Date 12-17 June 2022
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Frank Zimmermann (CERN, Meyrin, Switzerland); Hitoshi Tanaka (RIKEN, Hyogo, Japan); Porntip Sudmuang (SRLI, Nakhon, Thailand); Prapong Klysubun (SRLI, Nakhon, Thailand); Prapaiwan Sunwong (SRLI, Nakhon, Thailand); Thakonwat Chanwattana (SRLI, Nakhon, Thailand); Christine Petit-Jean-Genaz (CERN, Meyrin, Switzerland); Volker R.W. Schaa (GSI, Darmstadt, Germany)
Online ISBN 978-3-95450-227-1
Online ISSN 2673-5490
Received 06 June 2022
Revised 17 June 2022
Accepted 22 June 2022
Issue Date 24 June 2022
DOI doi:10.18429/JACoW-IPAC2022-TUPOTK052
Pages 1336-1338
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.