Author: Yousefi Sigari, Y.
Paper Title Page
MOPAB310 Vertical Phase Space Measurement Progress at Canadian Light Source 963
 
  • Y. Yousefi Sigari, D. Bertwistle, M.J. Boland
    CLS, Saskatoon, Saskatchewan, Canada
  • M.J. Boland
    University of Saskatchewan, Saskatoon, Canada
 
  A key feature of third-generation light sources is their small vertical opening angle, which is difficult to measure experimentally. To reconstruct the vertical phase space, one can scan the beam’s position using X-ray synchrotron radiation (XSR) and a pinhole camera. The XSR diagnostic beamline, operational in the wavelength region of 0.05 - 0.15 nm, in Canadian Light Source (CLS) is qualified to measure the beam position with X-ray radiation. Using the corrector magnets in CLS lattice made of 12 identical double-bend achromats (DBA) cells, vertical iterations can be executed parallel to the beam’s original orbit. The outcomes of this experiment are: 1) the vertical beam positions that are monitored by BPMs, and 2) the X-ray image of the beam that is projected through the pinhole. The bumps were simulated using Matlab Middle Layer (MML) for Accelerator control systems to get an insight of the source point’s position in the XSR’s bending magnet. The simulation shows the position of the source point depends on which corrector sets are chosen.  
poster icon Poster MOPAB310 [0.328 MB]  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2021-MOPAB310  
About • paper received ※ 19 May 2021       paper accepted ※ 28 July 2021       issue date ※ 13 August 2021  
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THPAB276 X-Ray Double Slit Interferometer Progress at CLS 4349
 
  • N.A. Simonson, Y. Yousefi Sigari
    University of Saskatchewan, Saskatoon, Canada
  • M.J. Boland
    CLS, Saskatoon, Saskatchewan, Canada
 
  The Canadian Light Source (CLS) is a 3rd generation synchrotron that is used to produce extremely bright synchrotron light that can be used for research. The light at the CLS is produced by an electron storage ring that has an emittance of 20 nm. A 4th generation synchrotron (CLS2) is planned which will reduce the emittance to less than 1 nm and thus reduce the transverse beam size significantly, making it very challenging to measure. A double slit interferometer can be used to measure small transverse beam sizes, as first described by Mitsuhashi. An x-ray double slit interferometer will be designed and tested at the current CLS with the goal of using this setup at CLS2.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2021-THPAB276  
About • paper received ※ 20 May 2021       paper accepted ※ 23 July 2021       issue date ※ 01 September 2021  
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