SARI-CAS, Pudong, Shanghai, People’s Republic of China
SSRF, Shanghai, People’s Republic of China
Bunch arrival time monitor (BAM) is an important tool to investigate the temporal characteristic of electron bunch in free electron lasers (FEL). Since the timing jitter of electron bunch will affect the FEL’s stability and the resolution of time-resolved experiment at FELs, it is nec-essary to precisely measure the electron bunch’s arrival time information to stabilize the electron bunch’s timing jitter using beam-based feedback. The BAM based on electro-optic modulator (EOM) is currently being devel-oping for Shanghai high-repetition-rate XFEL and Ex-treme light facility (SHINE). And the first BAM prototype has been installed on SXFEL for beam test. The beam test result shows that the estimated resolution of the pro-totype is about 27.5 fs rms.
