IPAC2021 - List of Authors (Hansknecht, J.)

Paper	Title	Page
WEPAB104	Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing	2840
	J.T. Yoskowitz, G.A. Krafft, G.G. Palacios Serrano, S.A.K. Wijethunga ODU, Norfolk, Virginia, USA J.M. Grames, J. Hansknecht, C. Hernandez-Garcia, M. Poelker, M.L. Stutzman, R. Suleiman JLab, Newport News, Virginia, USA S.B. van der Geer Pulsar Physics, Eindhoven, The Netherlands
	Funding: U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177. The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The photo-cathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element. The simulation results showed that both the number and energy of ions play a role in the pattern of QE degradation. The experiment results and conclusions supported by GPT simulations will be presented.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2021-WEPAB104
About •	paper received ※ 20 May 2021 paper accepted ※ 02 June 2021 issue date ※ 18 August 2021
Export •	reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)

Paper

Title

Page

Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing

2840

J.T. Yoskowitz, G.A. Krafft, G.G. Palacios Serrano, S.A.K. Wijethunga
ODU, Norfolk, Virginia, USA
J.M. Grames, J. Hansknecht, C. Hernandez-Garcia, M. Poelker, M.L. Stutzman, R. Suleiman
JLab, Newport News, Virginia, USA
S.B. van der Geer
Pulsar Physics, Eindhoven, The Netherlands

Funding: U.S. Department of Energy, Office of Science, Office of Nuclear Physics under contract DE-AC05-06OR23177.
The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The photo-cathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element. The simulation results showed that both the number and energy of ions play a role in the pattern of QE degradation. The experiment results and conclusions supported by GPT simulations will be presented.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2021-WEPAB104

About •

paper received ※ 20 May 2021 paper accepted ※ 02 June 2021 issue date ※ 18 August 2021

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)