Muons, Inc, Illinois, USA
An electron beam probe has been successfully used for the determination of accelerated particle density distributions. However, the apparatus used for this diagnostic had a large size and complex design which limit the broad use of this diagnostic for tomography of accelerated bunches. We propose a new approach to electron beam tomography: we will generate a continuous sheet of electrons. As the ion beam bunches pass through the sheet, they cause distortions in the distribution of sheet electrons arriving at CCD device on the other side of the beam that is interpreted to give a continuous measurement of the beam profile. The apparatus to generate the sheet beam is a strip cathode, which, compared to the scanning electron beam probe, is smaller, has a simpler design and less expensive manufacturing, has better magnetic shielding, has higher sensitivity, higher resolution, has better accuracy of measurement and better time resolution. With this device, it is possible to develop almost ideal tomography diagnostics of bunches in linear accelerators and in circular accelerators and storage rings.
