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RIS citation export for WEPAB252: Transient Beam-Beam Effect During Electron Bunch Replacement in the EIC

TY  - CONF
AU  - Qiang, J.
AU  - Blaskiewicz, M.
AU  - Hao, Y.
AU  - Luo, Y.
AU  - Montag, C.
AU  - Willeke, F.J.
AU  - Xu, D.
ED  - Liu, Lin
ED  - Byrd, John M.
ED  - Neuenschwander, Regis T.
ED  - Picoreti, Renan
ED  - Schaa, Volker R. W.
TI  - Transient Beam-Beam Effect During Electron Bunch Replacement in the EIC
J2  - Proc. of IPAC2021, Campinas, SP, Brazil, 24-28 May 2021
CY  - Campinas, SP, Brazil
T2  - International Particle Accelerator Conference
T3  - 12
LA  - english
AB  - The high luminosity, high polarization electron-ion collider (EIC) will provide great opportunities in nuclear physics study. In order to maintain high polarization, the electron beam will be replaced every few minutes during the collider operation. This frequent replacement of electron beams can affect proton beam quality during the collision. In this paper, we report on the study of the transient effect of electron beam replacement on proton beam emittance growth through strong-strong beam-beam simulation. The effect of electron beam injection imperfection will be included in the study.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 3228
EP  - 3231
KW  - electron
KW  - emittance
KW  - proton
KW  - injection
KW  - simulation
DA  - 2021/08
PY  - 2021
SN  - 2673-5490
SN  - 978-3-95450-214-1
DO  - doi:10.18429/JACoW-IPAC2021-WEPAB252
UR  - https://jacow.org/ipac2021/papers/wepab252.pdf
ER  -