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BiBTeX citation export for WEPAB169: Towards Ultra-Smooth Alkali Antimonide Photocathode Epitaxy

@inproceedings{montgomery:ipac2021-wepab169,
  author       = {E.J. Montgomery and O. Chubenko and G.S. Gevorkyan and R.G. Hennig and C. Jing and S.S. Karkare and H.A. Padmore and J.T. Paul and S. Poddar and P. Saha},
% author       = {E.J. Montgomery and O. Chubenko and G.S. Gevorkyan and R.G. Hennig and C. Jing and S.S. Karkare and others},
% author       = {E.J. Montgomery and others},
  title        = {{Towards Ultra-Smooth Alkali Antimonide Photocathode Epitaxy}},
  booktitle    = {Proc. IPAC'21},
  pages        = {3001--3004},
  eid          = {WEPAB169},
  language     = {english},
  keywords     = {lattice, cathode, interface, emittance, electron},
  venue        = {Campinas, SP, Brazil},
  series       = {International Particle Accelerator Conference},
  number       = {12},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {08},
  year         = {2021},
  issn         = {2673-5490},
  isbn         = {978-3-95450-214-1},
  doi          = {10.18429/JACoW-IPAC2021-WEPAB169},
  url          = {https://jacow.org/ipac2021/papers/wepab169.pdf},
  note         = {https://doi.org/10.18429/JACoW-IPAC2021-WEPAB169},
  abstract     = {{Photocathodes lead in brightness among electron emitters, but transverse momenta are unavoidably nonzero. Ultra-low transverse emittance would enable brighter, higher energy x-ray free-electron lasers (FEL), improved colliders, and more coherent, detailed ultrafast electron diffraction/microscopy (UED/UEM). Although high quantum efficiency (QE) is desired to avoid laser-induced nonlinearities, the state-of-the-art is 100 pC bunches from copper, 0.4 mm-mrad emittance. Advances towards 0.1 mm-mrad require ultra-low emittance, high QE, cryo-compatible materials. We report efforts towards epitaxial growth of cesium antimonide on lattice matched substrates. DFT calculations were performed to downselect from a list of candidate lattice matches. Co-evaporations achieving >3% QE at 532 nm followed by atomic force and Kelvin probe microscopy (AFM and KPFM) show ultra-low 313 pm rms (root mean square) physical and 2.65 mV rms chemical roughness. We simulate roughness-induced mean transverse energy (MTE) to predict <1 meV from roughness effects at 10 MV/m in as-grown optically thick cathodes, promising low emittance via epitaxial growth.}},
}