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BiBTeX citation export for WEPAB157: Understanding the Growth Dynamics Cs-Sb Thin Films via In-Situ Characterization Techniques: Towards Epitaxial Alkali Antimonide Photocathodes

@inproceedings{galdi:ipac2021-wepab157,
  author       = {A. Galdi and J. Balajka and I.V. Bazarov and L. Cultrera and W.J.I. DeBenedetti and M. Hines and C. Hu and J.M. Maxson and L. Moreschini and H. Paik and C.T. Parzyck and K.M. Shen},
% author       = {A. Galdi and J. Balajka and I.V. Bazarov and L. Cultrera and W.J.I. DeBenedetti and M. Hines and others},
% author       = {A. Galdi and others},
  title        = {{Understanding the Growth Dynamics Cs-Sb Thin Films via In-Situ Characterization Techniques: Towards Epitaxial Alkali Antimonide Photocathodes}},
  booktitle    = {Proc. IPAC'21},
  pages        = {2979--2982},
  eid          = {WEPAB157},
  language     = {english},
  keywords     = {electron, cathode, brightness, lattice, scattering},
  venue        = {Campinas, SP, Brazil},
  series       = {International Particle Accelerator Conference},
  number       = {12},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {08},
  year         = {2021},
  issn         = {2673-5490},
  isbn         = {978-3-95450-214-1},
  doi          = {10.18429/JACoW-IPAC2021-WEPAB157},
  url          = {https://jacow.org/ipac2021/papers/wepab157.pdf},
  note         = {https://doi.org/10.18429/JACoW-IPAC2021-WEPAB157},
  abstract     = {{Alkali antimonide photocathodes, such as Cs3Sb, have attractive properties, such as low emittance and high quantum efficiency, which makes them excellent candidates for next-generation high-brightness electron sources. A large number of studies in literature focus on quantum efficiency and lifetime, and fewer report chemical and structural analysis, despite the latter ultimately determine the brightness at the photocathode. Epitaxial, single-crystalline films would allow to study the intrinsic properties of alkali antimonide photocathodes and to optimize them for maximum brightness, but this goal remains elusive. A strong limiting factor is the extreme air sensitivity, preventing ex-situ structural and chemical analysis. We report a study on the growth of Cs-Sb films via molecular beam epitaxy with reflection high-energy electron diffraction to monitor the growth in real time. The samples were characterized via in-situ ultraviolet photoelectron spectroscopy, x-ray photoelectron spectroscopy and scanning tunneling microscopy. Cs3Sb and CsSb phases can be stabilized on appropriate single crystal substrates, with the latter reproducibly resulting in atomically smooth surfaces.}},
}