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RIS citation export for WEPAB018: Space-Charge Effects in Ionization Beam Profile Monitors

TY  - CONF
AU  - Shiltsev, V.D.
ED  - Liu, Lin
ED  - Byrd, John M.
ED  - Neuenschwander, Regis T.
ED  - Picoreti, Renan
ED  - Schaa, Volker R. W.
TI  - Space-Charge Effects in Ionization Beam Profile Monitors
J2  - Proc. of IPAC2021, Campinas, SP, Brazil, 24-28 May 2021
CY  - Campinas, SP, Brazil
T2  - International Particle Accelerator Conference
T3  - 12
LA  - english
AB  - Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs and develop an effective algorithm to reconstruct the beam sizes from the measured IPM profiles. Efficiency of the developed theory is illustrated in application to the Fermilab 8 GeV proton Booster IPMs.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 2628
EP  - 2631
KW  - proton
KW  - booster
KW  - space-charge
KW  - electron
KW  - synchrotron
DA  - 2021/08
PY  - 2021
SN  - 2673-5490
SN  - 978-3-95450-214-1
DO  - doi:10.18429/JACoW-IPAC2021-WEPAB018
UR  - https://jacow.org/ipac2021/papers/wepab018.pdf
ER  -