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@inproceedings{gibaru:ipac2021-thpab211,
author = {Q. Gibaru and M.B. Belhaj and C. Inguimbert and D. Lambert and M. Raine},
title = {{Monte Carlo Simulation of 3D Surface Morphologies for Secondary Electron Emission Reduction}},
booktitle = {Proc. IPAC'21},
pages = {4204--4207},
eid = {THPAB211},
language = {english},
keywords = {electron, simulation, multipactoring, GUI, experiment},
venue = {Campinas, SP, Brazil},
series = {International Particle Accelerator Conference},
number = {12},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2021},
issn = {2673-5490},
isbn = {978-3-95450-214-1},
doi = {10.18429/JACoW-IPAC2021-THPAB211},
url = {https://jacow.org/ipac2021/papers/thpab211.pdf},
note = {https://doi.org/10.18429/JACoW-IPAC2021-THPAB211},
abstract = {{Low energy electrons of few tens of eV may cause Multipactor breakdowns in waveguides driven by the Secondary Electron Emission Yield (SEY) of the walls. This risk is lowered by using low emissive surfaces and this topic has been studied experimentally and with numerical simulations. The dependence of the SEY on surface properties is well known*. Surface morphology has been widely used to reduce the SEY by forming roughness patterns on the surface**. All patterns do not have the same efficiency so their analysis in terms of SEY is relevant. Monte-Carlo simulation codes can be used to study the processes behind the SEY. The MicroElec module of GEANT4 has recently been extended with more materials and processes and validated with experimental data for SEY calculations**. In this work, simulation results are shown for a bulk sample capped with different roughness patterns. The effects of the shape parameters on the SEY are studied for typical dimensions between 20 µm and 100 µm. The results are checked with experimental SEY measurements on samples with similar roughness patterns.}},
}