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@inproceedings{hidaka:ipac2021-thpab198,
author = {Y. Hidaka and O.V. Chubar and C.A. Kitégi and T. Tanabe},
title = {{Commissioning of Current Strips for Elliptically Polarizing Undulators at NSLS-II}},
booktitle = {Proc. IPAC'21},
pages = {4160--4163},
eid = {THPAB198},
language = {english},
keywords = {MMI, undulator, insertion, insertion-device, synchrotron},
venue = {Campinas, SP, Brazil},
series = {International Particle Accelerator Conference},
number = {12},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2021},
issn = {2673-5490},
isbn = {978-3-95450-214-1},
doi = {10.18429/JACoW-IPAC2021-THPAB198},
url = {https://jacow.org/ipac2021/papers/thpab198.pdf},
note = {https://doi.org/10.18429/JACoW-IPAC2021-THPAB198},
abstract = {{Most of the Elliptically Polarizing Undulators (EPUs) at NSLS-II are equipped with current strips (or flat wires), attached to their vacuum chambers. These strips compensate the dynamic field integrals of the EPU to minimize undesirable nonlinear beam dynamics effect that can lead to reduction in injection efficiency and beam lifetime. For each EPU, we measured the field integrals of the insertion device alone, the current strips alone, and both, while creating horizontal bumps of different amplitudes at the straight section to assess the effectiveness of the compensation provided by the design current values for the strips. The commissioning results of these current strips are reported in this article.}},
}