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BiBTeX citation export for MOPAB352: High Power Test of a Dielectric Disk Loaded Accelerator for a Two Beam Wakefield Accelerator

@inproceedings{freemire:ipac2021-mopab352,
  author       = {B.T. Freemire and M.E. Conde and D.S. Doran and G. Ha and C.-J. Jing and W. Liu and M.M. Peng and S. Poddar and J.G. Power and J.H. Shao and C. Whiteford and E.E. Wisniewski and Y. Zhao},
% author       = {B.T. Freemire and M.E. Conde and D.S. Doran and G. Ha and C.-J. Jing and W. Liu and others},
% author       = {B.T. Freemire and others},
  title        = {{High Power Test of a Dielectric Disk Loaded Accelerator for a Two Beam Wakefield Accelerator}},
  booktitle    = {Proc. IPAC'21},
  pages        = {1096--1099},
  eid          = {MOPAB352},
  language     = {english},
  keywords     = {wakefield, acceleration, impedance, linear-collider, multipactoring},
  venue        = {Campinas, SP, Brazil},
  series       = {International Particle Accelerator Conference},
  number       = {12},
  publisher    = {JACoW Publishing, Geneva, Switzerland},
  month        = {08},
  year         = {2021},
  issn         = {2673-5490},
  isbn         = {978-3-95450-214-1},
  doi          = {10.18429/JACoW-IPAC2021-MOPAB352},
  url          = {https://jacow.org/ipac2021/papers/mopab352.pdf},
  note         = {https://doi.org/10.18429/JACoW-IPAC2021-MOPAB352},
  abstract     = {{As part of the Argonne 500 MeV short pulse Two Beam Wakefield Acceleration Demonstrator, a single cell X-band dielectric disk loaded accelerator (DDA) has been designed, fabricated, and tested at high power at the Argonne Wakefield Accelerator. The DDA should provide a short pulse (~20 ns) high gradient (>300 MV/m) accelerator while maintaining a reasonable r/Q and high group velocity. This will allow a significantly larger RF-to-beam efficiency than is currently possible for conventional accelerating structures. A low loss barium titantate ceramic, µ_{r} = 50, was selected, and a low temperature brazing alloy chosen to preserve the dielectric properties of the ceramic during brazing. High power testing produced breakdown at the triple junction, resulting from the braze joint design. No evidence of breakdown was observed on the iris of the disk, indicating that the maximum surface electric field on the dielectric was not reached. An improved braze joint has been designed and is in production, with high power testing to follow.}},
}