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@inproceedings{monk:ipac2021-mopab314,
author = {D.J. Monk and M. Babzien and S. Biedron and K.A. Brown and M.A. Fazio and D. Martin and M. Martínez-Ramón and M.A. Palmer and M.E. Papka and S.I. Sosa Guitron and T. Talbott and J. Tao},
% author = {D.J. Monk and M. Babzien and S. Biedron and K.A. Brown and M.A. Fazio and D. Martin and others},
% author = {D.J. Monk and others},
title = {{Surrogate Modeling for MUED with Neural Networks}},
booktitle = {Proc. IPAC'21},
pages = {970--971},
eid = {MOPAB314},
language = {english},
keywords = {electron, experiment, gun, network, operation},
venue = {Campinas, SP, Brazil},
series = {International Particle Accelerator Conference},
number = {12},
publisher = {JACoW Publishing, Geneva, Switzerland},
month = {08},
year = {2021},
issn = {2673-5490},
isbn = {978-3-95450-214-1},
doi = {10.18429/JACoW-IPAC2021-MOPAB314},
url = {https://jacow.org/ipac2021/papers/mopab314.pdf},
note = {https://doi.org/10.18429/JACoW-IPAC2021-MOPAB314},
abstract = {{Electron diffraction is among the most complex and influential inventions of the last century and contributes to research in many areas of physics and engineering. Not only does it aid in problems like materials and plasma research, electron diffraction systems like the MeV ultra-fast electron diffraction(MUED) instrument at the Brookhaven National Lab(BNL) also present opportunities to explore/implement surrogate modeling methods using artificial intelligence/machine learning/deep learning algorithms. Running the MUED system requires extended periods of uninterrupted runtime, skilled operators, and many varying parameters that depend on the desired output. These problems lend themselves to techniques based on neural networks(NNs), which are suited to modeling, system controls, and analysis of time-varying/multi-parameter systems. NNs can be deployed in model-based control areas and can be used simulate control designs, planned experiments, and to simulate employment of new components. Surrogate models based on NNs provide fast and accurate results, ideal for real-time control systems during continuous operation and may be used to identify irregular beam behavior as they develop.}},
}