Towards a Data Science Enabled MeV Ultrafast Electron Diffraction System

Fazio, Mariana; Babzien, Marcus; Biedron, Sandra; Brown, Kevin; Chen, Julian; Fedurin, Mikhail; Hurd, Alan; Li, Junjie; Martin, David; Martínez-Ramón, Manel; Monk, Destry; Moody, Nathan; Palmer, Mark; Papka, Michael; Prasankumar, Rohit; Sosa Guitron, Salvador; Sweeney, Christine; Talbott, Tyler; Tao, Jing

doi:10.18429/JACoW-IPAC2021-MOPAB286

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RIS citation export for MOPAB286: Towards a Data Science Enabled MeV Ultrafast Electron Diffraction System

TY  - CONF
AU  - Fazio, M.A.
AU  - Babzien, M.
AU  - Biedron, S.
AU  - Brown, K.A.
AU  - Chen, J.
AU  - Fedurin, M.G.
AU  - Hurd, A.J.
AU  - Li, J.J.
AU  - Martin, D.
AU  - Martínez-Ramón, M.
AU  - Monk, D.J.
AU  - Moody, N.A.
AU  - Palmer, M.A.
AU  - Papka, M.E.
AU  - Prasankumar, R.
AU  - Sosa Guitron, S.I.
AU  - Sweeney, C.
AU  - Talbott, T.
AU  - Tao, J.
ED  - Liu, Lin
ED  - Byrd, John M.
ED  - Neuenschwander, Regis T.
ED  - Picoreti, Renan
ED  - Schaa, Volker R. W.
TI  - Towards a Data Science Enabled MeV Ultrafast Electron Diffraction System
J2  - Proc. of IPAC2021, Campinas, SP, Brazil, 24-28 May 2021
CY  - Campinas, SP, Brazil
T2  - International Particle Accelerator Conference
T3  - 12
LA  - english
AB  - A MeV ultrafast electron diffraction (MUED) instrument is a unique characterization technique to study ultrafast processes in materials by a pump-probe technique. This relatively young technology can be advanced further into a turn-key instrument by using data science and artificial intelligence (AI) mechanisms in conjunctions with high-performance computing. This can facilitate automated operation, data acquisition and real time or near- real time processing. AI based system controls can provide real time feedback on the electron beam which is currently not possible due to the use of destructive diagnostics. Deep learning can be applied to the MUED diffraction patterns to recover valuable information on subtle lattice variations that can lead to a greater understanding of a wide range of material systems. A data science enabled MUED facility will also facilitate the application of this technique, expand its user base, and provide a fully automated state-of-the-art instrument. We will discuss the progress made on the MUED instrument in the Accelerator Test Facility of Brookhaven National Laboratory.
PB  - JACoW Publishing
CP  - Geneva, Switzerland
SP  - 906
EP  - 908
KW  - electron
KW  - network
KW  - experiment
KW  - real-time
KW  - laser
DA  - 2021/08
PY  - 2021
SN  - 2673-5490
SN  - 978-3-95450-214-1
DO  - doi:10.18429/JACoW-IPAC2021-MOPAB286
UR  - https://jacow.org/ipac2021/papers/mopab286.pdf
ER  -