| Paper | Title | Page |
|---|---|---|
| WEPGW030 | Beam Profile Monitor for Slow Extracted Beam Using Multi-Layered Graphene at J-PARC | 2532 |
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| Extracted-beam profiles in slow extraction at J-PARC has been measured by using secondary electrons emitted from a target array made by multi-layered graphen, in real time during spill time of around 2 seconds. The target array consists of 20 ribbons with width of 1 mm, pitch of 2 mm, and thickness of 1.1 micron. Secondary-electron current at each channel is measured by a current amplifier having sensitivity more than 1 pA. These configuration produces useful information for beam dynamics in slow extraction. We have set this monitor at the entrance of a septum magnet, then we can also measure the last few-turns beam with the extracted beam simultaneously. We will discuss about features of this instrument and recent beam study with 51 kW extracted-beams. | ||
| DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2019-WEPGW030 | |
| About • | paper received ※ 15 May 2019 paper accepted ※ 21 May 2019 issue date ※ 21 June 2019 | |
| Export • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |