| Paper | Title | Page |
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| WEPGW014 | A Non-Invasive THz Spectrometer for Bunch Length Characterization at European XFEL | 2495 |
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The European X-ray Free-Electron Laser provides one of the most powerful X-ray laser pulses to a wide range of experiments. These experiments strongly benefit from the exact knowledge of the electron bunch current profile and demand for stable and shortest-possible pulse lengths. During the 2018 summer shutdown, the 4-staged grating spectrometer CRISP* has been installed at a diffraction radiation (DR) beamline just upstream of the undulator beamline switchyard. The DR at final electron beam energies of up to 17.5 GeV enables non-invasive bunch length characterization based on form factor measurements down to a few micrometers. Fast detectors and electronics allow for the characterization of the whole bunch train with repetition rates above 1 MHz. This contribution will present commissioning results of the THz beamline as well as first measured form factors and reconstructed electron current profiles.
* S. Wesch et al., Nuclear Instruments and Methods in Physics Research Section A 665 (2011) pp. 40-47 |
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| DOI • | reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2019-WEPGW014 | |
| About • | paper received ※ 14 May 2019 paper accepted ※ 20 May 2019 issue date ※ 21 June 2019 | |
| Export • | reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml) | |