Paper |
Title |
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THPMP016 |
Design of the Condenser System and Imaging System for a UEM |
3485 |
SUSPFO054 |
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- T. Chen, W. Li, Y.J. Pei
USTC/NSRL, Hefei, Anhui, People’s Republic of China
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The ultrafast electron microscope provides a useful tool for exploring fine structure and observing dynamic process at nanometer and picosecond scale, which has been extensively applied in chemistry and biological field. After emitting from the electron gun, electron beams are focused on the stage sample by the condenser system and then be projected by the imaging system on the screen. In the present study, a two-lens condenser system is simulated by Parmela and a three-lens imaging system is designed using thin-lens approximation. Besides, the shape factor of metallic spheres which have different radius for perturbation method is measured, which is conductive to measuring the Z/Q parameter and the electric field along the axis of the C-band 3MeV photocathode gun for the UEM.
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DOI • |
reference for this paper
※ https://doi.org/10.18429/JACoW-IPAC2019-THPMP016
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About • |
paper received ※ 14 May 2019 paper accepted ※ 22 May 2019 issue date ※ 21 June 2019 |
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