Title |
Fast Intensity Monitor Based on Channeltron Electron Multiplier |
Authors |
- G.M.A. Calvi, V. Lante, L. Lanzavecchia, G. Magro, A. Parravicini, E. Rojatti, C. Viviani
CNAO Foundation, Milan, Italy
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Abstract |
The paper concerns the Fast Intensity Monitor (FIM) designed for the CNAO (Centro Nazionale di Adroterapia Oncologica), the Italian facility of Oncological Hadrontherapy. The FIM detector has been designed with the purpose of having a continuous and non-destructive measurement of the beam intensity in the High Energy Beam Transfer (HEBT) line. The passage of the beam through a thin aluminum foil produces secondary electrons whose yield depends on beam species (protons or carbon ions), intensity and energy. Secondary electrons are focused on the Channeltron Electron Multiplier (CEM) input, multiplied and sensed over a precision resistor. In order to minimize the perturbation to the beam, the foil is grounded and the read out electronics is floating. This makes electronics design harder but it is a key point to make FIM use possible continuously even during patients treatment. Measurements performed with the FIM are discussed and checked against reference detectors.
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Paper |
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Conference |
IPAC2018, Vancouver, BC, Canada |
Series |
International Particle Accelerator Conference (9th) |
Proceedings |
Link to full IPAC2018 Proccedings |
Session |
MC6 Poster Session |
Date |
02-May-18 09:00–12:00 |
Main Classification |
06 Beam Instrumentation, Controls, Feedback, and Operational Aspects |
Sub Classification |
T03 Beam Diagnostics and Instrumentation |
Keywords |
electron, electronics, proton, high-voltage, detector |
Publisher |
JACoW Publishing, Geneva, Switzerland |
Editors |
Shane Koscielniak (TRIUMF, Vancouver, BC, Canada); Todd Satogata (JLab, Newport News, VA, USA); Volker RW Schaa (GSI, Darmstadt, Germany); Jana Thomson (TRIUMF, Vancouver, BC, Canada) |
ISBN |
978-3-95450-184-7 |
Published |
June 2018 |
Copyright |
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