Author: Kondoh, T.
Paper Title Page
THOAB3
 Ultrafast Relativistic-Energy Electron Microscopy  
 
  • J. Yang, K. Kan, T. Kondoh, K. Tanimura, Y. Yoshida
    ISIR, Osaka, Japan
  • N. Terunuma, J. Urakawa
    KEK, Ibaraki, Japan
  
  An ultrafast electron microscopy (UEM) using a relativistic-energy femtosecond-pulse electron beam has being developed at Osaka University. We succeeded to generate a 100-fs-pulse electron beam with energy of 3.1 MeV using a photocathode RF gun. In the demonstrations of UEM, we succeeded to observe the TEM imaging of polystyrene and gold nanoparticles by the accumulating measurement of 3.1-MeV femtosecond electron pulses. The relativistic-energy single-pulse electron imaging is also available under the low-magnification observation, i.e. 300 times. The UEM has also been succeeded for the study of the ultrafast structural dynamics in materials with the single-shot electron diffraction observation.  
slides icon Slides THOAB3 [12.396 MB]  
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