Author: Jacewicz, M.
Paper Title Page
TUPIK084 The EPICS Based Control System at the FREIA Laboratory 1890
 
  • K. Fransson, K.J. Gajewski, M. Jacewicz, M. Jobs, R.J.M.Y. Ruber, V.G. Ziemann
    Uppsala University, Uppsala, Sweden
 
  FREIA (Facility for REsearch and Instrumentation for Accelerator development) Laboratory at Uppsala University, Sweden, is a new facility, inaugurated 2013. Initially FREIA is testing and developing superconducting accelerating cavities and high power RF sources in collaboration with the European Spallation Source (ESS). Later projects include testing of superconducting cavities and magnets for the high luminosity LHC. The high level control, alarm system and archiving is implemented in EPICS. Presently this includes a helium liquefaction plant, a horizontal test cryostat, two high power RF amplifiers, a low level RF system, environment monitoring and safety systems. Some attention will be given to integration of commercially acquired systems as well as the safety system, interlocks and radiation monitoring. The implementation of the EPICS environment follows closely that of ESS and thus can provide a test bench for developments at ESS.  
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-TUPIK084  
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WEPVA016 Dielectric Laser Accelerator Investigation, Setup Substrate Manufacturing and Investigation of Effects of Laser Induced Electromigration RF Cavity Breakdown Influences 3286
 
  • M. Hamberg, M. Jacewicz, J. Ögren
    Uppsala University, Uppsala, Sweden
  • M. Karlsson, E. Vargas Catalan
    Uppsala University, Department of Engineering Sciences, Uppsala, Sweden
  • M. Kuittinen, I. Vartiainen
    UEF, Joensuu, Finland
 
  Funding: I thank Stockholm Uppsala centre for FEL research for funding.
Dielectric laser acceleration (DLA) where the high electric fields in lasers are used to accelerate electrons next to nanofabricated dielectric structures has recently been proven in proof of concept studies. In this paper I describe investigations setup and substrate manufacturing. Additionally we describe using the setup for evaluating RF structure breakdown due to laser induced electromigration occurences.
 
DOI • reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-WEPVA016  
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