IPAC2017 - List of Authors (Chi, Z.J.)

Paper	Title	Page
MOPAB077	Spatial Decoding Electro-Optic Bunch Measurement at Tsinghua Thomson Scattering X-ray Source	302
SUSPSIK075	use link to see paper's listing under its alternate paper code
	W. Wang, Z.J. Chi, Y.-C. Du, W.-H. Huang, C.-X. Tang, L.X. Yan, Z. Zhang TUB, Beijing, People's Republic of China
	Electron bunches with duration of sub-picosecond are essential in ultraviolet and X-ray free electron laser (XFEL) to reach the desired peak current. Electro-optic (EO) technique is suitable for temporal profile measure-ment of these ultrashort bunches which is one of the key diagnostics in FELs. An electro-optic monitor based on spatial sampling has recently been designed and installed for bunch profile diagnostic at Tsinghua Thomson scat-tering X-ray source (TTX). An ultrashort laser pulse is used to detect the field induced birefringence of the bunch Coulomb field in an electro-optic crystal and the monitor allows direct time-resolved single-shot measure-ment of bunch profile with an accuracy of 135 femtosec-onds for a 40 MeV electron bunch in a non-destructive way, which can simultaneously record the relative time jitter between probe laser and electron bunch. This paper performs the layout of the setup and presents the current measurement results.
DOI •	reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-MOPAB077
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Paper

Title

Page

MOPAB077

Spatial Decoding Electro-Optic Bunch Measurement at Tsinghua Thomson Scattering X-ray Source

302

SUSPSIK075

use link to see paper's listing under its alternate paper code

W. Wang, Z.J. Chi, Y.-C. Du, W.-H. Huang, C.-X. Tang, L.X. Yan, Z. Zhang
TUB, Beijing, People's Republic of China

Electron bunches with duration of sub-picosecond are essential in ultraviolet and X-ray free electron laser (XFEL) to reach the desired peak current. Electro-optic (EO) technique is suitable for temporal profile measure-ment of these ultrashort bunches which is one of the key diagnostics in FELs. An electro-optic monitor based on spatial sampling has recently been designed and installed for bunch profile diagnostic at Tsinghua Thomson scat-tering X-ray source (TTX). An ultrashort laser pulse is used to detect the field induced birefringence of the bunch Coulomb field in an electro-optic crystal and the monitor allows direct time-resolved single-shot measure-ment of bunch profile with an accuracy of 135 femtosec-onds for a 40 MeV electron bunch in a non-destructive way, which can simultaneously record the relative time jitter between probe laser and electron bunch. This paper performs the layout of the setup and presents the current measurement results.

DOI •

reference for this paper ※ https://doi.org/10.18429/JACoW-IPAC2017-MOPAB077

Export •

reference for this paper using ※ BibTeX, ※ LaTeX, ※ Text/Word, ※ RIS, ※ EndNote (xml)