Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

Obradors-Campos, Diego; Ahedo, BegoÃ±a; Barcala, Jose; Calero, Jesus; Calvo, Pedro; Domínguez, Manuel; EstÃ©vez, Antonio; Figarola, JosÃ©; García-Tabarés, Luis; Gavela, Daniel; Gómez, Pablo; Guirao, Angel; Gutiérrez, Jose Luis; Iturbe, Rafael; Lagares, Juan Ignacio; López, Daniel; LÃ³pez, Borja; Martínez, Luis; Munilla, Javier; Oliver, Concepcion; Pérez Morales, Jose; Podadera, Ivan; RodrÃ­guez GarcÃ­a, Enrique; Toral, Fernando; Varela, Rodrigo; Vázquez, Cristina

doi:10.18429/JACoW-IPAC2017-TUPIK030

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Text/Word citation export for TUPIK030: Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench

D. Obradors-Campos et al., “Characterization of the AMIT Internal Ion Source With a Devoted DC Extraction Test Bench”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, paper TUPIK030, pp. 1740-1742, ISBN: 978-3-95450-182-3, https://doi.org/10.18429/JACoW-IPAC2017-TUPIK030, http://jacow.org/ipac2017/papers/tupik030.pdf, 2017.