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TY - CONF AU - Gulliford, C.M. AU - Bartnik, A.C. AU - Bazarov, I.V. AU - Maxson, J.M. ED - Schaa, Volker RW ED - Arduini, Gianluigi ED - Pranke, Juliana ED - Seidel, Mike ED - Lindroos, Mats TI - Multi-objective Genetic Optimization of Single Shot Ultrafast Electron Diffraction Beamlines J2 - Proc. of IPAC2017, Copenhagen, Denmark, 14â19 May, 2017 C1 - Copenhagen, Denmark T2 - International Particle Accelerator Conference T3 - 8 LA - english AB - We present the results of multi-objective genetic algorithm optimizations of two single-shot ultrafast electron diffraction (UED) beam lines. The first is based on a 225 kV dc gun featuring a novel cryocooled photocathode system and buncher cavity. The second uses a 100 MV/m 1.6 cell normal conducting rf (NCRF) gun, as well as a 9 cell 2 Pi/3 bunching cavity placed between two solenoids. Optimizations of the transverse projected emittance as a function of bunch charge are presented and discussed in terms of the scaling laws derived in the charge saturation limit. Additionally, optimization of the transverse coherence length as a function of final rms bunch length at the sample location have been performed. These results demonstrate the viability of the approaches taken for both beamlines studied as well as the use of using genetic algorithms in the design and operation of UED beamlines. PB - JACoW CP - Geneva, Switzerland SP - 1615 EP - 1617 KW - gun KW - emittance KW - electron KW - cathode KW - cavity DA - 2017/05 PY - 2017 SN - 978-3-95450-182-3 DO - 10.18429/JACoW-IPAC2017-TUPAB126 UR - http://jacow.org/ipac2017/papers/tupab126.pdf ER -