Modeling Cathode Roughness, Work Function, and Field Enhancement Effects on Electron Emission

Dimitrov, Dimitre; Bell, George; Ben-Zvi, Ilan; Feng, Jun; Karkare, Siddharth; Padmore, Howard; Smedley, John; Smithe, David; Veitzer, Seth

doi:10.18429/JACoW-IPAC2017-THPAB066

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RIS citation export for THPAB066: Modeling Cathode Roughness, Work Function, and Field Enhancement Effects on Electron Emission

TY - CONF
AU - Dimitrov, D.A.
AU - Bell, G.I.
AU - Ben-Zvi, I.
AU - Feng, J.
AU - Karkare, S.S.
AU - Padmore, H.A.
AU - Smedley, J.
AU - Smithe, D.N.
AU - Veitzer, S.A.
ED - Schaa, Volker RW
ED - Arduini, Gianluigi
ED - Pranke, Juliana
ED - Seidel, Mike
ED - Lindroos, Mats
TI - Modeling Cathode Roughness, Work Function, and Field Enhancement Effects on Electron Emission
J2 - Proc. of IPAC2017, Copenhagen, Denmark, 14â19 May, 2017
C1 - Copenhagen, Denmark
T2 - International Particle Accelerator Conference
T3 - 8
LA - english
AB - Recent developments in material design and growth have resulted in photocathodes that can deliver high quantum efficiency and are sufficiently robust to use in high electric field gradient photoinjectors and free electron lasers. The growth process usually produces photoemissive material layers with rough surface profiles that lead to transverse accelerating fields and possible work function variation resulting in emittance growth. To better understand the effects of surface roughness on emitted electron beams, we have developed realistic three-dimensional models for photocathode materials with grated surface structures. They include general modeling of electron excitation due to photon absorption, charge transport and emission from rough surfaces taking into account image charge and field enhancement effects. We implemented these models in the VSim particle-in-cell code. We report results from simulations using different photocathode materials with grated and flat surfaces to investigate how controlled roughness, work function variation, and field enhancement affect emission properties.
PB - JACoW
CP - Geneva, Switzerland
SP - 3869
EP - 3871
KW - electron
KW - emittance
KW - simulation
KW - scattering
KW - photon
DA - 2017/05
PY - 2017
SN - 978-3-95450-182-3
DO - 10.18429/JACoW-IPAC2017-THPAB066
UR - http://jacow.org/ipac2017/papers/thpab066.pdf
ER -