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TY - CONF AU - Iwashita, Y. AU - Fuwa, Y. AU - Hayano, H. AU - Hino, M. AU - Kubo, T. AU - Oikawa, H. AU - Saeki, T. AU - Tongu, H. ED - Schaa, Volker RW ED - Arduini, Gianluigi ED - Pranke, Juliana ED - Seidel, Mike ED - Lindroos, Mats TI - Measurement of Thin Film Coating on Superconductors J2 - Proc. of IPAC2017, Copenhagen, Denmark, 14â19 May, 2017 C1 - Copenhagen, Denmark T2 - International Particle Accelerator Conference T3 - 8 LA - english AB - Multilayer thin film coating is a promising technology to enhance performance of superconducting cavities. Until recently, principal parameters to achieve the sufficient performance had not been known, such as the thickness of each layer. We proposed a method to deduce a set of the parameters to exhibit a good performances. In order to verify the scheme, we are trying to make some experiments on the subject at Kyoto. The sample preparation and the test setup for the measurement apparatus will be discussed. PB - JACoW CP - Geneva, Switzerland SP - 1043 EP - 1045 KW - cryogenics KW - controls KW - experiment KW - FPGA KW - photon DA - 2017/05 PY - 2017 SN - 978-3-95450-182-3 DO - 10.18429/JACoW-IPAC2017-MOPVA076 UR - http://jacow.org/ipac2017/papers/mopva076.pdf ER -