| Title |
Group Velocity Matching in Dielectric-Lined Waveguides and its Role in Electron-THz Interaction |
| Authors |
- A.L. Healy, G. Burt
Cockcroft Institute, Lancaster University, Lancaster, United Kingdom
- D.M. Graham
The University of Manchester, The Photon Science Institute, Manchester, United Kingdom
- S.P. Jamison
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
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| Abstract |
Terahertz(THz)-driven dielectric-lined waveguides have applications in electron manipulation, particularly acceleration, as the use of dielectric allows for phase velocities below the speed of light. However matching a single frequency to the correct velocity does not maximise electron-THz interaction; waveguide dispersion typically results in an unmatched group velocity and so the pulse envelope of a short THz pulse changes along the length of the structure. This reduces field amplitude and therefore accelerating gradient as the envelope propagates at a different velocity to the electron. Presented here is an analysis of the effect of waveguide dispersion on THz-electron interaction and its influence on structure dimensions and choice of THz pulse generation. This effect on net acceleration is demonstrated via an example of a structure excited by a single-cycle THz pulse, with a comparison of multi-cycle, lower intensity THz pulses on net acceleration.
|
| Paper |
download WEPVA019.PDF [1.846 MB / 3 pages] |
| Export |
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| Conference |
IPAC2017, Copenhagen, Denmark |
| Series |
International Particle Accelerator Conference (8th) |
| Proceedings |
Link to full IPAC2017 Proccedings |
| Session |
Posters Wednesday 3 |
| Date |
17-May-17 16:00–18:00 |
| Main Classification |
03 Novel Particle Sources and Acceleration Techniques |
| Sub Classification |
A15 New Acceleration Techniques |
| Keywords |
electron, acceleration, simulation, accelerating-gradient, interface |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Volker RW Schaa (GSI, Darmstadt, Germany); Gianluigi Arduini (CERN, Geneva, Switzerland); Juliana Pranke (ESS, Lund, Sweden); Mike Seidel (PSI, Villigen, Switzerland); Mats Lindroos (ESS, Lund, Sweden) |
| ISBN |
978-3-95450-182-3 |
| Published |
May 2017 |
| Copyright |
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