|MOPOR005||Longitudinal Wakefields in the Undulator Section of SXFEL User Facility||595|
|SUPSS052||use link to see paper's listing under its alternate paper code|
Shanghai soft x-ray free electron laser (SXFEL) user facility based on multi-stage seeded-FEL and self-amplified spontaneous emission (SASE) is recently proposed, which is aiming at generating 4-2nm fully-coherent, high-brightness FEL pulse. In this paper, the wakefields arise from the resistive wall and surface roughness in the vacuum chamber is obtained by theoretical models*. And the computations of geometric wakefields are carried out using ABCI**. According to the tracked beam profile, the overall wakefields in the undulator section of SXFEL user facility are presented.
* K. Bane, G. Stupakov, SLAC-PUB-15951, May 2014.
** ABCI website: http://abci.kek.jp/abci.htm
|DOI •||reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-MOPOR005|
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