Author: Arpaia, P.
Paper Title Page
MOPMB018 Metrological Characterization of the Bunch Length Measurement by Means of a RF Deflector at the ELI-NP Compton Gamma source 122
  • L. Sabato
    U. Sannio, Benevento, Italy
  • D. Alesini, C. Vaccarezza, A. Variola
    INFN/LNF, Frascati (Roma), Italy
  • P. Arpaia
    CERN, Geneva, Switzerland
  • P. Arpaia, A. Liccardo
    Naples University Federico II, Science and Technology Pole, Napoli, Italy
  • A. Giribono
    University of Rome La Sapienza, Rome, Italy
  • A. Mostacci, L. Palumbo
    Rome University La Sapienza, Roma, Italy
  • L. Sabato
    INFN-Napoli, Napoli, Italy
  Bunch length measurement in linac can be carried out using a RF deflector, which provides a transverse kick to the beam. The transverse beam size on a screen, placed after the RF deflector, represents the bunch length. In this paper, the metrological characterization of the bunch length measurement technique is proposed. The uncertainty and the systematic errors are estimated by means of a sensitivity analysis to the measurement parameters. The proposed approach has been validated through simulation by means of ELEGANT code on the parameters interesting for the electron linac of the Compton source at the Extreme Light Infrastructure - Nuclear Physics (ELI-NP).  
DOI • reference for this paper ※ DOI:10.18429/JACoW-IPAC2016-MOPMB018  
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