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RIS citation export for WEPMR015: Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica

TY - CONF
AU - Ge, G.M.
AU - Furuta, F.
AU - Gonnella, D.
AU - Hall, D.L.
AU - Hoffstaetter, G.H.
AU - Liepe, M.
AU - O'Connell, T.I.
AU - Sears, J.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Surface Topography Techniques at Cornell University: Optical Inspection and Surface Replica
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - Surface imperfections significantly limit the performance of superconducting radio frequency (SRF) cavities. The development of surface topography techniques aims to locate the surface flaws in an SRF cavity and profile their geometry details. This effort plays an important role of quality control in cavity productions as well as provides contour information of the defects for understanding quench mechanisms. The surface topography techniques at Cornell University include an optical inspection system and surface replica technique. In this paper, we present the details of the techniques and show features found in the SRF cavities at Cornell.
PB - JACoW
CP - Geneva, Switzerland
SP - 2292
EP - 2294
KW - cavity
KW - SRF
KW - laser
KW - controls
KW - GUI
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-WEPMR015
UR - http://jacow.org/ipac2016/papers/wepmr015.pdf
ER -