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RIS citation export for THPOY049: Helical Undulator as a Source of Spectromicroscopy Beamline of ILSF

AU - Amiri, S.
AU - Gholampour, A.
AU - Jafarzadeh, M.
AU - Lamehi, M.
AU - Rahighi, J.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Helical Undulator as a Source of Spectromicroscopy Beamline of ILSF
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - Regarding user requirements of spectromicroscopy beamline such as high flux, small spot size, linear and circular polarization light, a helical undulator have been chosen as a source for this beamline. Radiation properties of the source e.g. flux, flux density, brilliance, size and divergence of the photon beam, power, power density, angular distribution of power and flux on the axis of the undulator have been considered by theoretical formula and using SPECTRA code. At the circular polarization, the first harmonic covers the energies in the 100-1300 eV range and for the linear polarization energy ranges, 100-1000 eV and 1000-1500 eV, are provided by the first and third harmonics respectively. In the case of circular and linear polarization mode, maximum flux in the central cone for maximum undulator strength are 4.5 × 10¹⁶ (ph/s) at kX=ky=3.6 and 2.4 × 10¹⁶ (ph/s) at K=5.
CP - Geneva, Switzerland
SP - 4217
EP - 4219
KW - polarization
KW - undulator
KW - electron
KW - photon
KW - radiation
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-THPOY049
UR - http://jacow.org/ipac2016/papers/thpoy049.pdf
ER -