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TY - CONF AU - Amiri, S. AU - Gholampour, A. AU - Jafarzadeh, M. AU - Lamehi, M. AU - Rahighi, J. ED - Petit-Jean-Genaz, Christine ED - Kim, Dong Eon ED - Kim, Kyung Sook ED - Ko, In Soo ED - Schaa, Volker RW TI - Helical Undulator as a Source of Spectromicroscopy Beamline of ILSF J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016 C1 - Busan, Korea T2 - International Particle Accelerator Conference T3 - 7 LA - english AB - Regarding user requirements of spectromicroscopy beamline such as high flux, small spot size, linear and circular polarization light, a helical undulator have been chosen as a source for this beamline. Radiation properties of the source e.g. flux, flux density, brilliance, size and divergence of the photon beam, power, power density, angular distribution of power and flux on the axis of the undulator have been considered by theoretical formula and using SPECTRA code. At the circular polarization, the first harmonic covers the energies in the 100-1300 eV range and for the linear polarization energy ranges, 100-1000 eV and 1000-1500 eV, are provided by the first and third harmonics respectively. In the case of circular and linear polarization mode, maximum flux in the central cone for maximum undulator strength are 4.5 × 10¹⁶ (ph/s) at kX=ky=3.6 and 2.4 × 10¹⁶ (ph/s) at K=5. PB - JACoW CP - Geneva, Switzerland SP - 4217 EP - 4219 KW - polarization KW - undulator KW - electron KW - photon KW - radiation DA - 2016/06 PY - 2016 SN - 978-3-95450-147-2 DO - 10.18429/JACoW-IPAC2016-THPOY049 UR - http://jacow.org/ipac2016/papers/thpoy049.pdf ER -