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TY - CONF AU - Tipping, P.J. AU - McKenzie, J.W. AU - Militsyn, B.L. ED - Petit-Jean-Genaz, Christine ED - Kim, Dong Eon ED - Kim, Kyung Sook ED - Ko, In Soo ED - Schaa, Volker RW TI - Simulations of Field Emitted Dark Current Dynamics in DC Photoinjectors J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016 C1 - Busan, Korea T2 - International Particle Accelerator Conference T3 - 7 LA - english AB - Field emission is a concern in injectors with DC photoelectron guns because of the constant generation of dark current, which is accelerated down the beam line and can deteriorate the photoemitted bunch quality and lead to hardware damage. Simulations were carried out on the co-propagation of a field emitted, dark current halo and a photoemitted bunch in a typical 350 kV gun as used in an ERL or FEL injector, followed by a single cell buncher cavity. The photoemitted bunch repelled the halo longitudinally, leaving the area in the centre of the bunch with very low dark current, surrounded by two peaks of relatively high current at the front and back of the bunch. The peaks in current occur at all levels of dark current and were about 3.5 times the amplitude of the undisturbed dark current. The buncher caused the dark current to overcompress, forming a 'ghost' pulse an order of magnitude larger than the initial level of dark current, in front of the photoemitted bunch. PB - JACoW CP - Geneva, Switzerland SP - 3971 EP - 3974 KW - simulation KW - gun KW - electron KW - cavity KW - space-charge DA - 2016/06 PY - 2016 SN - 978-3-95450-147-2 DO - 10.18429/JACoW-IPAC2016-THPOW018 UR - http://jacow.org/ipac2016/papers/thpow018.pdf ER -