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RIS citation export for THPMY016: Graphene Coating for the Reduction of the Secondary Electron Yield

TY - CONF
AU - Sian, B.S.
AU - Kinloch, I.
AU - Lin, L.
AU - Malyshev, O.B.
AU - Valizadeh, R.
AU - Valles, V.
AU - Xia, G.X.
AU - Yu, G.L.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Graphene Coating for the Reduction of the Secondary Electron Yield
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - Secondary electron emission is a limiting factor for a performance of many instruments ranging from small gauges and detectors to waveguides and charged particle accelerators. There have been several methods of reducing this effect, e.g. the method of using a material with a low Secondary Electron Yield (SEY) or thin film coating with such a low SEY material. This paper describes the effect of SEY mitigation with graphene coatings on aluminium substrate. The maximum SEY (dmax) was decreased from 2.4 for bare aluminium to 1.4 with a graphene coating. Measurements were taken using an electron gun and a Faraday cup, the electron energies varied between 80 eV and 1 keV with a bias of -18 V on the sample. Other biases of -3, -5, -9, -25, -50 and -75 V were also tested however there was no effect on the SEY.
PB - JACoW
CP - Geneva, Switzerland
SP - 3688
EP - 3690
KW - electron
KW - cavity
KW - vacuum
KW - proton
KW - framework
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-THPMY016
UR - http://jacow.org/ipac2016/papers/thpmy016.pdf
ER -