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RIS citation export for THOAB03: Ultrafast Electron Microscopy using 100 Femtosecond Relativistic-Energy Electron Beam

TY - CONF
AU - Yang, J.
AU - Kan, K.
AU - Tanimura, K.
AU - Urakawa, J.
AU - Yoshida, Y.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Ultrafast Electron Microscopy using 100 Femtosecond Relativistic-Energy Electron Beam
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - An ultrafast detection technique on 100 fs time scales over sub-nanometer (even atomic) spatial dimensions has long been a goal for the scientists to reveal and understand the ultrafast structural-change induced dynamics in materials. In this paper, the generation of femtosecond electron pulses using the RF gun and the first prototype of femtosecond time-resolved relativistic-energy ultrafast electron microscopy (UEM) are reported. Finally, both relativistic-energy electron diffraction and image measurements in the UEM prototype are presented.
PB - JACoW
CP - Geneva, Switzerland
SP - 3183
EP - 3185
KW - electron
KW - emittance
KW - gun
KW - brightness
KW - laser
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-THOAB03
UR - http://jacow.org/ipac2016/papers/thoab03.pdf
ER -