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RIS citation export for MOPMB058: Bunch Arrival Time Monitor Test at PAL-XFEL ITF

TY - CONF
AU - Hong, J.H.
AU - Han, J.H.
AU - Kim, C.
AU - Yang, H.
ED - Petit-Jean-Genaz, Christine
ED - Kim, Dong Eon
ED - Kim, Kyung Sook
ED - Ko, In Soo
ED - Schaa, Volker RW
TI - Bunch Arrival Time Monitor Test at PAL-XFEL ITF
J2 - Proc. of IPAC2016, Busan, Korea, May 8-13, 2016
C1 - Busan, Korea
T2 - International Particle Accelerator Conference
T3 - 7
LA - english
AB - Femtosecond resolution electron bunch arrival time monitor (BAM) will be required for the beam-based RF phase feedback during PAL-XFEL operation. Two S-band cavity-type BAMs were manufactured for the test at the PAL-XFEL injector test facility (ITF). The resonance frequencies of the cavities are 2856 MHz and 2826.25 MHz. Electron beam induced signal from the cavities was digitized using a low level RF (LLRF) module. In this paper, the resolution of these cavities are analyzed and a possible improvement for better resolution are discussed.
PB - JACoW
CP - Geneva, Switzerland
SP - 223
EP - 225
KW - pick-up
KW - LLRF
KW - cavity
KW - simulation
KW - resonance
DA - 2016/06
PY - 2016
SN - 978-3-95450-147-2
DO - 10.18429/JACoW-IPAC2016-MOPMB058
UR - http://jacow.org/ipac2016/papers/mopmb058.pdf
ER -