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DOI:10.18429/JACoW-IPAC2016-WEOBB02
Title Status of Wakefield Monitor Experiments at the CLIC Test Facility
Authors
  • R.L. Lillestøl, E. Adli, J. Pfingstner
    University of Oslo, Oslo, Norway
  • N. Aftab, S. Javeed
    PINSTECH, Islamabad, Pakistan
  • R. Corsini, S. Döbert, W. Farabolini, A. Grudiev, W. Wuensch
    CERN, Geneva, Switzerland
Abstract For the very low emittance beams in CLIC, it is vital to mitigate emittance growth which leads to reduced luminosity in the detectors. One factor that leads to emittance growth is transverse wakefields in the accelerating structures. In order to combat this the structures must be aligned with a precision of a few um. For achieving this tolerance, accelerating structures are equipped with wakefield monitors that measure higher-order dipole modes excited by the beam when offset from the structure axis. We report on such measurements, performed using prototype CLIC accelerating structures which are part of the module installed in the CLIC Test Facility 3 (CTF3) at CERN. Measurements with and without the drive beam that feeds rf power to the structures are compared. Improvements to the experimental setup are discussed, and finally remaining measurements that should be performed before the completion of the program are summarized.
Paper download WEOBB02.PDF [0.333 MB / 3 pages]
Slides download WEOBB02_TALK.PDF [2.928 MB]
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Conference IPAC2016, Busan, Korea
Series International Particle Accelerator Conference (7th)
Proceedings Link to full IPAC2016 Proccedings
Session Contributed Oral Presentaations, Beam Instrumentation and Feedback
Date 11-May-16   11:30–12:30
Main Classification 06 Beam Instrumentation, Controls, Feedback and Operational Aspects
Sub Classification T03 Beam Diagnostics and Instrumentation
Keywords detector, emittance, pick-up, experiment, electron
Publisher JACoW, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-147-2
Published June 2016
Copyright
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