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Title High Average RF Power Tests With 2 RF Vacuum Windows at PITZ
  • Y. Renier, G. Asova, M. A. Bakr, P. Boonpornprasert, J.D. Good, M. Groß, C. Hernandez-Garcia, H. Huck, I.I. Isaev, D.K. Kalantaryan, M. Krasilnikov, O. Lishilin, G. Loisch, D. Malyutin, D. Melkumyan, A. Oppelt, M. Otevřel, G. Pathak, T. Rublack, I.V. Rybakov, F. Stephan, G. Vashchenko, Q.T. Zhao
    DESY Zeuthen, Zeuthen, Germany
  • M. Bousonville, S. Choroba, S. Lederer
    DESY, Hamburg, Germany
Abstract The Photo Injector Test facility at DESY, Zeuthen site (PITZ), was built with the aim to develop and characterize electron sources for future usage at FLASH and at the European XFEL. Recently, the main focus at PITZ has been the study of gun reliability and photoinjector performance at high average power. The goal is to get stable and reliable operation with 6.4 MW peak power in the gun at 650 us RF pulse length and 10 Hz repetition rate. To achieve this, a new RF feed system with two RF windows was installed at PITZ in 2014. During this test, the old gun 4.2 with a modified back-plane design for better cathode contact has been used. In this contribution the results of the RF conditioning of gun 4.2 with a detailed interlock analysis will be reported as well as results from recent electron beam characterization.
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Conference IPAC2016, Busan, Korea
Series International Particle Accelerator Conference (7th)
Proceedings Link to full IPAC2016 Proccedings
Session Poster Session
Date 10-May-16   16:00–18:00
Main Classification 02 Photon Sources and Electron Accelerators
Sub Classification A08 Linear Accelerators
Keywords gun, operation, vacuum, Windows, emittance
Publisher JACoW, Geneva, Switzerland
Editors Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Dong Eon Kim (PAL, Pohang, Republic of Korea); Kyung Sook Kim (PAL, Pohang, Republic of Korea); In Soo Ko (POSTECH, Pohang, Republic of Korea); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-147-2
Published June 2016
Copyright © 2016 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0