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| WEOBB01 |
Sub-micrometer Resolution Transverse Electron Beam Size Measurement System based on Optical Transition Radiation |
1964 |
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- A.S. Aryshev, N. Terunuma, J. Urakawa
KEK, Ibaraki, Japan
- S.T. Boogert, V. Karataev
JAI, Egham, Surrey, United Kingdom
- D. Howell
Oxford University, Physics Department, Oxford, Oxon, United Kingdom
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Optical Transition Radiation (OTR) appears when a charged particle crosses a boundary between two media with different dielectric properties has widely been used as a tool for transverse profile measurements of charged particle beams in numerous facilities worldwide. The resolution of the conventional monitors is defined by the Point Spread Function (PSF) dimension - the source distribution generated by a single electron and projected by an optical system onto a screen. For small electron beam dimensions, the PSF form significantly depends on various parameters of the optical system like diffraction of the OTR tails, spherical and chromatic aberrations, etc. In our experiment we managed to create a system which can practically measure the PSF distribution and using a new self-calibration method we are able to calculate transverse electron beam size. Here we represent the development, data analysis and novel calibration technique of a sub-micrometer electron beam profile monitor based on the measurements of the PSF shape, which OTR visibility is sensitive to micrometer electron beam dimensions.
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Slides WEOBB01 [2.506 MB]
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| WEOBB02 |
Bunch Length Diagnostic with Sub-femtosecond Resolution for High Brightness Electron Beams |
1967 |
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- G. Andonian, E. Hemsing, P. Musumeci, J.B. Rosenzweig
UCLA, Los Angeles, California, USA
- A.Y. Murokh
RadiaBeam, Santa Monica, USA
- D. Xiang
SLAC, Menlo Park, California, USA
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Next generation light sources require electron beams with high peak currents, typically achieved by compression techniques. The temporal diagnosis of these ultra-short beams demands enhanced resolution. We describe a scheme to achieve a temporal resolution on the order of sub-femtoseconds. The scheme is based on encoding the longitudinal profile of the beam on a transverse angular modulation, based on an interaction between the electron beam and a high-power laser in an undulator. This imposes a fast-sweep of the beam, on the order of sub-femtoseconds. A subsequent sweep in the orthogonal dimension by an rf deflecting cavity, imposes a "slow-sweep" on the order of sub-picoseconds. In this paper, we demonstrate applicability of this diagnostic scheme at the BNL ATF and specify the techniques required for practical applicability.
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Slides WEOBB02 [1.120 MB]
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| WEOBB03 |
Electron Bunch Profile Diagnostics in the Few fs Regime using Coherent Smith-Purcell Radiation |
1970 |
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- N. Delerue
LAL, Orsay, France
- R. Bartolini, G. Doucas, K. Pattle, C. Perry, A. Reichold, R. Tovey
JAI, Oxford, United Kingdom
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Funding: John Fell Fund, University of Oxford
The rapid developments in the field of laser-driven particle acceleration hold the prospect of intense, highly relativistic electron bunches that are only a few fs long. The determination of the temporal profile of such a bunch presents new challenges. The use of a radiative process such as Smith-Purcell radiation (SPR), whereby the beam is made to radiate a small amount of e/m radiation and the temporal profile is then reconstructed from the measured spectral distribution of the radiation, is particularly promising in this respect. We summarize the advantages of SPR and present the design parameters of a forthcoming experiment at the FACET facility at SLAC with bunch lengths of the order of 60fs rms. We also discuss a new approach to the problem of the recovery of the ‘missing phase’, which is essential for the accurate reconstruction of the bunch profile.
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Slides WEOBB03 [4.627 MB]
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