Author: Sugahara, R.
Paper Title Page
TUPC119 A Comprehensive Study of Nanometer Resolution of the IPBPM at ATF2* 1296
 
  • Y.I. Kim, H. Park
    Kyungpook National University, Daegu, Republic of Korea
  • S.T. Boogert
    Royal Holloway, University of London, Surrey, United Kingdom
  • J.C. Frisch, D.J. McCormick, J. Nelson, T.J. Smith, G.R. White, M. Woodley
    SLAC, Menlo Park, California, USA
  • Y. Honda, R. Sugahara, T. Tauchi, N. Terunuma, J. Urakawa
    KEK, Ibaraki, Japan
 
  Funding: Work supported in part by Department of Energy Contract DE-AC02-76SF00515.
High-resolution beam position monitors (IPBPMs) have been developed in order to measure the electron beam position at the focus point of ATF2 to a few nanometers in the vertical plane. To date, the IPBPM system has operated in test mode with a highest demonstrated resolution of 8.7 nm in the ATF extraction line during 2008. After expected noise source calculations there still remains 7.9 nm of noise of unexplained origin. We summarize the experimental work on the IPBPM system since this measurement and outline the possible origins of these sources. We then present a study plan to be performed at the ATF2 facility designed to identify and to improve the resolution performance and comment on the expected ultimate resolution of this system.