Author: Smirnov, A.Yu.
Paper Title Page
MOPC040 The Measurement of Transversal Shunt Impedance of RF Deflector 163
 
  • A.Yu. Smirnov, M.V. Lalayan, N.P. Sobenin
    MEPhI, Moscow, Russia
  • A.A. Zavadtsev
    Nano, Moscow, Russia
 
  This paper presents the results of transverse shunt impedance measurement performed using field perturbation technique and comparison with numerical MWS simulations. The structure under test is the S-band 3-cell deflecting cavity. The mentioned cavity operates with a dipole TM11-like mode with a phase shift of 120 deg per cell. The analyses were carried out with use of two types of perturbing beads: dielectric beads and metallic rings. The latter type perturbs the on-axis magnetic field much stronger than the electric field, which allows us calculating transversal shunt impedance using on-axis EM fields values.